pub struct Nullable<T>(/* private fields */);
Expand description
An offset of a given width for which NULL (zero) is a valid value.
Implementations§
Trait Implementations§
source§impl<T> Zeroable for Nullable<T>where
T: AnyBitPattern,
impl<T> Zeroable for Nullable<T>where
T: AnyBitPattern,
impl<T> AnyBitPattern for Nullable<T>where
T: AnyBitPattern,
impl<T: Copy> Copy for Nullable<T>
impl<T: Eq> Eq for Nullable<T>
impl<T> StructuralPartialEq for Nullable<T>
Auto Trait Implementations§
impl<T> Freeze for Nullable<T>where
T: Freeze,
impl<T> RefUnwindSafe for Nullable<T>where
T: RefUnwindSafe,
impl<T> Send for Nullable<T>where
T: Send,
impl<T> Sync for Nullable<T>where
T: Sync,
impl<T> Unpin for Nullable<T>where
T: Unpin,
impl<T> UnwindSafe for Nullable<T>where
T: UnwindSafe,
Blanket Implementations§
source§impl<T> BorrowMut<T> for Twhere
T: ?Sized,
impl<T> BorrowMut<T> for Twhere
T: ?Sized,
source§fn borrow_mut(&mut self) -> &mut T
fn borrow_mut(&mut self) -> &mut T
Mutably borrows from an owned value. Read more
source§impl<T> CheckedBitPattern for Twhere
T: AnyBitPattern,
impl<T> CheckedBitPattern for Twhere
T: AnyBitPattern,
source§type Bits = T
type Bits = T
Self
must have the same layout as the specified Bits
except for
the possible invalid bit patterns being checked during
is_valid_bit_pattern
.source§fn is_valid_bit_pattern(_bits: &T) -> bool
fn is_valid_bit_pattern(_bits: &T) -> bool
If this function returns true, then it must be valid to reinterpret
bits
as &Self
.source§impl<T> CloneToUninit for Twhere
T: Clone,
impl<T> CloneToUninit for Twhere
T: Clone,
source§unsafe fn clone_to_uninit(&self, dst: *mut T)
unsafe fn clone_to_uninit(&self, dst: *mut T)
🔬This is a nightly-only experimental API. (
clone_to_uninit
)source§impl<T> FixedSize for Twhere
T: Scalar,
impl<T> FixedSize for Twhere
T: Scalar,
source§const RAW_BYTE_LEN: usize = const RAW_BYTE_LEN: usize = std::mem::size_of::<T::Raw>();
const RAW_BYTE_LEN: usize = const RAW_BYTE_LEN: usize = std::mem::size_of::<T::Raw>();
The raw size of this type, in bytes. Read more