Struct AdjustedMetrics

pub struct AdjustedMetrics {
    pub has_overlaps: bool,
    pub lsb: Option<f32>,
    pub advance_width: Option<f32>,
}

Information and adjusted metrics generated while drawing an outline glyph.

When applying hints to a TrueType glyph, the outline may be shifted in the horizontal direction, affecting the left side bearing and advance width of the glyph. This captures those metrics.

Fields

has_overlaps: bool

True if the underlying glyph contains flags indicating the presence of overlapping contours or components.

lsb: Option<f32>

If present, an adjusted left side bearing value generated by the scaler.

This is equivalent to the horiBearingX value in FT_Glyph_Metrics.

advance_width: Option<f32>

If present, an adjusted advance width value generated by the scaler.

This is equivalent to the advance.x value in FT_GlyphSlotRec.

Trait Implementations

impl Clone for AdjustedMetrics

fn clone(&self) -> AdjustedMetrics

Returns a copy of the value.

fn clone_from(&mut self, source: &Self)

Performs copy-assignment from source.

impl Debug for AdjustedMetrics

fn fmt(&self, f: &mut Formatter<'_>) -> Result

Formats the value using the given formatter.

impl Default for AdjustedMetrics

fn default() -> AdjustedMetrics

Returns the “default value” for a type.

impl Copy for AdjustedMetrics